Match! Function List

• Fast single and multiple phase identification from powder diffraction data
• Use free-of-charge reference patterns calculated from the COD (incl. I/Ic), any ICDD PDF database, any ICSD/Retrieve version (released 1993-2002; valid licence required) and/or your own diffraction data (or patterns calculated from crystal structure data (e.g. CIF files)) in phase identification
• Flexible handling of reference databases (incl. user databases); you can easily switch between different reference databases without the necessity to perform a new database indexation
• Create reference databases for X-ray and neutron diffraction e.g. from cif-files
• Comfortable user database manager for easy maintenance of user data (add/import/edit/delete/sort entries)
• Powerful CIF- and ICSD/Retrieve import, incl. calculation of powder pattern, I/I_c and density
• Atomic coordinates available e.g. in the ICSD, the ICDD PDF-4+ or free-of-charge reference data are displayed in the data sheets and included in the CIF- or Textfile-exports (e.g. for Rietveld analysis)
• Displaying of Miller indices (hkl) in diffraction patterns and entry data sheets
• View crystal structures in Diamond with just a few clicks
• Fully integrated handling of your own diffraction data with PDF data (search-match, retrieval, data viewing)
• Automatic residual searching with respect to identified phases
• Automatic raw data processing: α2-stripping, background subtraction, peak search, profile fitting, error correction
• Automatic optimization of peak searching sensitivity
• Fitting of all (or selected) peak parameters to exp. profile data
• Comfortable manual editing of peaks (add/shift/delete/fit) using mouse or keyboard
• Semi-quantitative analysis (Reference Intensity Ratio method)
• Straight-forward usage of additional knowledge (composition, PDF subfiles, crystallographic data, color, density etc.)
• Integrated database retrieval system and viewer for PDF and user datasheets
• Multiple step undo/redo
• Support for new PDF entry numbers (9 digits)
• User-configurable automatic operation
• Full parameter control with instant rearrangement of the results list
• Automatic d-value shifting during search-match process (optionally)
• Intensity contribution to figure-of-merit can be reduced for preferred-orientation cases
• Comfortable graphical and tabular comparison of peak data and candidate patterns
• Mouse-controlled pattern graphics zooming and tracking
• User-configurable HTML-reports
• Online update (automatic or manual)
• Supported diffraction data file formats (automatic detection):
  • ASCII profile (start, step, intensities or 2 columns)
  • Bruker/Siemens raw data (old and new) (*.raw)
  • Bruker/Siemens DIFFRAC AT peak data (*.dif)
  • DBWS (*.rfl, *.dat)
  • ENDEAVOUR peak list (2 columns: 2theta/d intensity; *.dif)
  • Inel raw data (*.dat)
  • Ital Structures raw data (*.esg)
  • Jade/MDI/SCINTAG raw data (*.mdi)
  • JEOL ASCII Export raw data (*.txt)
  • PANalytical XRDML Scan raw data (*.xrdml)
  • PANalytical/Philips peak data (*.udi)
  • PANalytical/Philips raw data (*.rd, *.udf)
  • Rigaku raw data (*.raw)
  • SCINTAG raw data (*.raw, *.rd)
  • Shimadzu raw data (*.raw)
  • Siemens (*.uxd)
  • Sietronics XRD scan data (*.cpi)
  • Stoe raw data (*.raw)
  • Stoe peak data (*.pks)

  Please contact Crystal Impact if the file format you are using is not yet supported!

System requirements

• Personal Computer with Microsoft Windows 98, ME, NT 4.0, 2000, XP, Vista or Windows 7 operating system
• Microsoft Internet Explorer 5.01 or higher
• 128 megabytes of RAM (256 megabytes recommended)
• Hard disk with minimum 600 MB of free disk space
• Graphics resolution of 1024 x 768 pixels with 32,768 colors ("High Color")
• DVD drive