Version 2: Instant Usage of Additional Information
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With the new version, it is now extremely easy to directly use any kind of
additional information about the sample (like the elements that can
or must be present), without the need to open a separate
dialog like in the previous version. All corresponding selections
you make on the "Restraints" or "Additional entries" tabs on the
upper right-hand side are instantly reflected in the Results list
at the bottom of the screen (and of course
also apply to the entries that are investigated during the Search-Match
calculation).
Match! now uses the same perpetual restrainting mechanism that you may already
know from Pearson's Crystal Data: While entering your
selection criteria, any modification will instantly be reflected e.g. in the table of
resulting entries and the entry count.
As an example, we assume that you would like to enter the additional
information that the element Si must be present. Here is what the
screen looks like before:
Now, simply press on the element "Si" in the periodic table on the
upper right hand side. The Results list at the bottom is instantly
modified: All entries for Al2O3 (Corundum) that were present
before are now gone, and the number of entries matching your selection
criteria (displayed to the right of "Restraints" on the tab control) has been significantly reduced (from 74228 to 6915):
In a similar manner, it is also possible to add specific entries
to the table of candidate entries (Results list) at the bottom:
Simply click on the tab "Additional entries",
then enter the corresponding selection criteria like you just did
with the element "Si". For example, in order to add Quartz to your
list of candidate entries, simply type "quartz" in
the corresponding field next to "Name:" on the "Additional entries"
tabsheet. All entries which match this selection criterion will
instantly be added to the table of candidate entries, so you can
e.g. compare them to your experimental pattern.
Go to Match! 2 Features Overview...
Previous: Display and compare multiple diffraction patterns...
Next: Saving of selection criteria for restraints and additional entries...
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